The CMI153 features dual measurement technology that automatically detects either ferrous or non-ferrous substrates and then employs either magnetic induction or eddy-current technology. Built upon our highly successful CMI150 architecture the CMI153 delivers an improved measurement probe with enhanced performance and superior substrate sensitivity.
Useful in a wide variety of settings, the CMI153 measures non-conductive coatings over non-ferrous substrates (primarily Al, Cu as close to 100% IACS conductivity is required) and non-magnetic coatings over ferrous substrates. The system was specially designed to handle the needs of platers, coaters, and quality professionals.
The system was specially designed to handle the needs of platers, coaters, and quality professionals.